Schmytkova E.A., Rizakhanov R.N., Levin A.D.,
Polyanskiy M.N., Sigalaev S.K., Savushkina S.V., Sokolova N.A., Kazakov V.A.
A brief overview of the work and the prospects of certified measurement laboratory
Key words: Сommon use center, metrological supervision, accredited laboratory, scanning electron mi-croscope, atomic-force microscope, Raman spectrometer, X-ray diffractometer, standarts, ceramic nanocomposite, carbon nanotubes, particle size analyzer. strategically focused on solving the problems of metrological supervision and com-pliance assessment of nanotechnology production in aerospace industry.
Contacts: E-mail: nanocentre@kerc.msk.ru
Pp. 49-54. |